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Delay-time effects between exposure and post-exposure bake in acetal-based deep-UV photoresists

机译:缩醛基深紫外光致抗蚀剂在曝光和曝光后烘烤之间的延迟时间影响

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Abstract: This paper presents some methods for the investigationof delay time I$-3$/ induced effects typical of anadvanced acetal-based photoresist, and strategies toimprove the latent image stability. Dissolution ratemonitoring was used to investigate the increasingformation of a surface inhibition layer with extendedintervals I$-3$/. The impact of certain additives, theapplication of a protective coating (AZ$+R$/ Aquatar),and modified process conditions on the inhibition layerwere studied in detail. The photoacid induced acetalcleavage was monitored by UV-spectroscopy (248 nm).Upon KrF excimer laser irradiation the resistabsorbance increases, due to the progressing formationof a strongly absorbing aldehyde fragment. SEM picturesconfirm a linear relationship between the efficiency ofthe acetal cleavage and acid diffusion into unexposedresist areas. Acid evaporation during PEB wasdetermined by a novel method, the so-called Sandwich`Blue' Test. Interpretations of the experimentalresults and some optimization strategies are given. !31
机译:摘要:本文提出了一些研究滞后时间I $ -3 $ /诱发的乙缩醛基光致抗蚀剂典型效应的方法,并提出了改善潜像稳定性的策略。溶出速率监测用于研究具有延长间隔I $ -3 $ /的表面抑制层的形成。详细研究了某些添加剂的影响,防护涂层的应用(AZ $ + R $ / Aquatar)以及改进的工艺条件对抑制层的影响。通过紫外光谱(248 nm)监测光酸诱导的缩醛裂解。在KrF受激准分子激光照射下,由于逐渐形成强烈吸收的醛片段,因此抗吸收性增加。 SEM照片证实了缩醛裂解的效率和酸扩散到未曝光的抗蚀剂区域之间的线性关系。 PEB过程中的酸蒸发是通过一种新颖的方法,即所谓的Sandwich Blue测试来确定的。给出了实验结果的解释和一些优化策略。 !31

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