首页> 外国专利> Nonlinear circuit element or interconnection structure, e.g. a copper oxide rectifier, is formed on an integrated circuit by successive formation of a diffusion barrier layer, a copper layer and a copper oxide layer

Nonlinear circuit element or interconnection structure, e.g. a copper oxide rectifier, is formed on an integrated circuit by successive formation of a diffusion barrier layer, a copper layer and a copper oxide layer

机译:非线性电路元件或互连结构,例如通过依次形成扩散阻挡层,铜层和氧化铜层在集成电路上形成氧化铜整流器

摘要

Formation of a nonlinear circuit element on an integrated circuit (IC), by successive formation of a diffusion barrier layer, a copper layer and a copper oxide layer. An Independent claim is also included for an electrical interconnection structure comprising the layers described above on a substrate. Preferred Features: The copper oxide layer is a deposited layer or an oxidized copper layer formed by applying and patterning a dielectric layer, depositing and selectively etching a diffusion barrier layer on the copper layer and applying a copper oxide layer on the exposed copper.
机译:通过依次形成扩散阻挡层,铜层和氧化铜层,在集成电路(IC)上形成非线性电路元件。对于包括在基板上的上述层的电互连结构,也包括独立权利要求。优选的特征:氧化铜层是沉积层或氧化的铜层,其通过施加和构图介电层,在铜层上沉积和选择性地蚀刻扩散阻挡层并且在暴露的铜上施加氧化铜层而形成。

著录项

  • 公开/公告号DE19920757A1

    专利类型

  • 公开/公告日2000-03-02

    原文格式PDF

  • 申请/专利权人 LSI LOGIC CORP. FORT COLLINS;

    申请/专利号DE1999120757

  • 发明设计人 YAKURA JAMES P.;

    申请日1999-05-05

  • 分类号H01L21/328;H01L29/861;H01L23/62;

  • 国家 DE

  • 入库时间 2022-08-22 01:42:05

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