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METHOD OF CLEANING SURFACE OF PROCESS CHAMBER

机译:工艺室表面清洁方法

摘要

PROBLEM TO BE SOLVED: To provide a method of cleaning the surface of a process chamber which can surely remove the matter having adhered to the surface of the process chamber, without doing damage to the surface of the process chamber. ;SOLUTION: After finish of the etching treatment to a specified number of wafers W, the anodized surface of the upper chamber part 5 in the process chamber 2 is wiped with cloth or the like wet with IPA or water. Next, a chemical vessel containing H2O2 is prepared, and H2O2 within the chemical vessel is heated to a temperature just before boiling. Then, the upper chamber 5 is put in the heated H2O2, and it is let alone for a specified time. Whereupon, reduction occurs to byproducts adhering to the anodized surface of the upper chamber part 5, and the byproducts are removed.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:提供一种清洁处理室表面的方法,该方法可以可靠地去除粘附在处理室表面上的物质,而不会损坏处理室的表面。 ;解决方案:完成对指定数量的晶片W的蚀刻处理后,用浸有IPA或水的布等擦拭处理室2中上腔室部分5的阳极氧化表面。接下来,制备含有H 2 O 2的化学容器,并将该化学容器内的H 2 O 2加热至刚好在沸腾之前的温度。然后,将上腔室5放入加热的H 2 O 2中,并且在规定的时间内将其搁置。因此,减少了附着在上腔室部件5的阳极氧化表面上的副产物,并去除了副产物。;版权:(C)2001,JPO

著录项

  • 公开/公告号JP2001127035A

    专利类型

  • 公开/公告日2001-05-11

    原文格式PDF

  • 申请/专利权人 APPLIED MATERIALS INC;

    申请/专利号JP19990308048

  • 发明设计人 OGATA KIYONARI;TAJIMA DAISUKE;

    申请日1999-10-29

  • 分类号H01L21/3065;

  • 国家 JP

  • 入库时间 2022-08-22 01:32:37

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