首页> 外国专利> Method of calculating thermal resistance in semiconductor package accommodating semiconductor chip within a case which can be applied to calculation for semiconductor package with radiation fins

Method of calculating thermal resistance in semiconductor package accommodating semiconductor chip within a case which can be applied to calculation for semiconductor package with radiation fins

机译:壳体内容纳半导体芯片的半导体封装中的热阻的计算方法,可以应用于带有散热片的半导体封装的计算

摘要

The thermal resistance of an entire semiconductor package with a semiconductor chip and radiation fins is calculated based on thermal resistance of resin between the semiconductor chip and case, thermal resistance of the radiation fins, and thermal resistance of three heat radiation paths in the semiconductor package. One of said three heat radiation paths is passing through the bottom surface of the case. The other of said three radiation paths is passing through the leadframe. The other of three radiation paths is passing through sides of the case other than the leadframe.
机译:基于半导体芯片和壳体之间的树脂的热阻,散热片的热阻以及半导体封装中三个散热路径的热阻,来计算具有半导体芯片和散热片的整个半导体封装的热阻。所述三个热辐射路径之一穿过壳体的底表面。所述三个辐射路径中的另一个正穿过引线框架。三个辐射路径中的另一个通过引线框以外的其他侧面。

著录项

  • 公开/公告号US6238086B1

    专利类型

  • 公开/公告日2001-05-29

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US19990239835

  • 发明设计人 SAKAE KITAJO;KAZUYUKI MIKUBO;

    申请日1999-01-29

  • 分类号G01N251/80;G01N252/00;

  • 国家 US

  • 入库时间 2022-08-22 01:04:15

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