首页> 外国专利> Method for controlling re-writing operation for memory cell in semiconductor integrated circuit, semiconductor integrated circuit, semiconductor device equpped with many of the semiconductor integrated circuits, and electronic apparatus using the semiconductor device

Method for controlling re-writing operation for memory cell in semiconductor integrated circuit, semiconductor integrated circuit, semiconductor device equpped with many of the semiconductor integrated circuits, and electronic apparatus using the semiconductor device

机译:控制半导体集成电路中的存储单元的重写操作的方法,半导体集成电路,配备有许多半导体集成电路的半导体器件以及使用该半导体器件的电子设备

摘要

A semiconductor integrated circuit is provided wherein, when a sense amplifier 3 detects H data, the potential on a plate line PL switches from the power supply potential VDD to the GND potential. In other words, the timing at which the potential on the plate line is shifted from the power supply potential VDD to the GND potential is set immediately after the sense amplifier reads data. As a result, the start timing for a re-writing operation can be quickened.
机译:提供了一种半导体集成电路,其中,当读出放大器 3 检测到H数据时,板线PL上的电势从电源电势VDD切换到GND电势。换句话说,在读出放大器读取数据之后,立即设置板线上的电势从电源电势VDD移位到GND电势的定时。结果,可以加快用于重写操作的开始定时。

著录项

  • 公开/公告号US2002015325A1

    专利类型

  • 公开/公告日2002-02-07

    原文格式PDF

  • 申请/专利权人 MARUYAMA AKIRA;

    申请/专利号US20010904448

  • 发明设计人 AKIRA MARUYAMA;

    申请日2001-07-12

  • 分类号G11C11/22;

  • 国家 US

  • 入库时间 2022-08-22 00:47:56

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