首页> 外国专利> METHOD TO FORM SELF-ALIGNED ELEVATED SOURCE / DRAIN BY SELECTIVE REMOVAL OF GATE DIELECTRIC IN THE SOURCE / DRAIN REGION FOLLOWED BY POLY DEPOSITION AND CMP

METHOD TO FORM SELF-ALIGNED ELEVATED SOURCE / DRAIN BY SELECTIVE REMOVAL OF GATE DIELECTRIC IN THE SOURCE / DRAIN REGION FOLLOWED BY POLY DEPOSITION AND CMP

机译:通过沉积和CMP选择性去除源/漏区的栅介质形成自校正上升源/漏的方法。

摘要

A method of manufacturing a self aligned elevatedsource / drain (S/D). A first insulating layer is formed over asubstrate. The first insulating layer having at least a gateopening and source / drain (S/D) openings adjacent to the gateopening. Spacer portions of the first insulating layer definethe gate opening. A gate dielectric layer is formed over thesubstrate in the gate opening. A conductive layer is formedover the substrate. The conductive layer fills the gate openingand the source / drain (S/D) openings. The conductive layer isdoped with dopants. The conductive layer is planarized to form agate over the gate dielectric layer and filling the gate openingand filling the source / drain (S/D) opening to form elevatedsource / drain (S/D) regions. The conductive layer is preferablyplanarized so that the top surface of the conductive layer islevel with the top surface of the first insulating layer. Thespacer portions are removed to form spacer openings. LDD regionsare formed in the substrate in the spacer opening. A dielectriclayer is formed over the substrate filling the spacer openings.Source / drain (S/D) regions are formed in the substrate underthe elevated source / drain (S/D) regions.
机译:一种自对准高架的制造方法源极/漏极(S / D)。在绝缘层上形成第一绝缘层。基质。第一绝缘层至少具有栅极栅极附近的开口和源极/漏极(S / D)开口开幕。第一绝缘层的间隔部分限定门口。栅极介电层形成在栅极开口中的基板。形成导电层在基板上。导电层填充栅极开口和源/漏(S / D)开口。导电层是掺杂有掺杂剂。将导电层平坦化以形成在栅极介电层上形成栅极并填充栅极开口并填充源/漏(S / D)开口以形成高架源/漏(S / D)区域。导电层优选为平面化,使得导电层的顶面与第一绝缘层的顶表面齐平。的去除间隔物部分以形成间隔物开口。 LDD地区在间隔件开口中的基板中形成有金属。电介质在填充间隔物开口的衬底上方形成层。源/漏(S / D)区域形成在下面的衬底中高的源/漏(S / D)区域。

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