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HIGH-DENSITY NOR-TYPE FLASH MEMORY DEVICE AND A PROGRAMMING METHOD THEREOF

机译:高密度NOR型闪存器件及其编程方法

摘要

This method according to the program of the flash memory device is started, first, the flash memory cells are selected in accordance with the word / byte unit in the flash memory cells of the memory cell array. Then, the selected memory cells are programmed in sequence to a predetermined threshold voltage is lower than the target threshold voltage. Then, the selected flash memory cells are divided in a threshold voltage of said predetermined groups of the said target at the same time to the threshold voltage or the flash memory cell are programmed in sequence. According to the program algorithm, even if the density of the flash memory device increases it is possible to supply a sufficient amount of current required for the charge pump circuit integrated circuit without increasing the program size of the die due to.
机译:开始根据闪存设备的程序的该方法,首先,根据存储单元阵列的闪存单元中的字/字节单位选择闪存单元。然后,将选择的存储单元依次编程为预定阈值电压低于目标阈值电压。然后,将所选择的闪存单元同时划分为所述目标的所述预定组的阈值电压,以将该阈值电压或闪存单元依次编程。根据该程序算法,即使闪存器件的密度增加,也可以提供电荷泵电路集成电路所需的足够量的电流,而不会因此而增加管芯的程序尺寸。

著录项

  • 公开/公告号KR100322470B1

    专利类型

  • 公开/公告日2002-02-07

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990029786

  • 发明设计人 이두섭;

    申请日1999-07-22

  • 分类号H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:56

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