首页> 外国专利> EPMA determination of different micro-substances in composition ratio and have the same configuration elements

EPMA determination of different micro-substances in composition ratio and have the same configuration elements

机译:EPMA测定不同微物质的组成比并具有相同的配置元素

摘要

PROBLEM TO BE SOLVED: To obtain an EPM determination method capable of accurately determining a plurality of micro-substances containing two or more kinds of same constitutional elements, different in elemental compositional ratio and smaller than a characteristic X-ray generating region at the time of the radiation with electron beam to a practical degree by EPMA. SOLUTION: A micro-substance to be measured is caught on a filter to be irradiated with electron beam and the intensities of characteristic X-rays from two kinds of constitutional elements excited by the irradiation with electron beam are measured and the relative intensities of X-rays of two kinds of these constitutional elements are calculated from the measured intensities of characteristic X-rays and the relative X-ray intensity ratio between two kinds of these constitutional elements is calculated from the obtained relative X-ray intensities. The relative X-ray intensity ratio of two kinds of the constitutional elements in this micro-substance is compared with the threshold value of the relative X-ray intensity ratio of the same constitutional elements for fractional judgment calculated by a Monte Carlo simulation method to fractionally judge the micro-substance and the determination of the micro-substance is performed from the result of this fractional judgment.
机译:解决的问题:获得一种EPM确定方法,该方法能够准确地确定包含两种或更多种相同组成元素,元素组成比不同并且小于特征X射线生成区域时的两种或更多种相同构成元素的微物质。 EPMA用实际的电子束辐射。解决方案:将要测量的微量物质捕获在过滤器上,以对其进行电子束辐照,并测量两种组分的特征X射线强度,这些特征元素是通过电子束辐照而激发的,并且X-射线的相对强度根据所测量的特征X射线的强度来计算这些构成元素中的两种的X射线,并根据所获得的相对X射线强度来计算两种构成元素之间的相对X射线的强度比。将这种微量物质中两种构成元素的相对X射线强度比与相同构成元素的相对X射线强度比的阈值进行比较,以便通过蒙特卡罗模拟方法对分数进行分数判定。判断微量物质,并根据该分数判断的结果进行微量物质的确定。

著录项

  • 公开/公告号JP3405275B2

    专利类型

  • 公开/公告日2003-05-12

    原文格式PDF

  • 申请/专利权人 日本軽金属株式会社;

    申请/专利号JP19990200738

  • 发明设计人 長田 義男;

    申请日1999-07-14

  • 分类号G01N23/225;G01N1/02;G01N1/28;

  • 国家 JP

  • 入库时间 2022-08-22 00:21:53

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号