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X-RAY SPECTROSCOPY ELEMENT AND FLUORESCENT X-RAY ANALYZER

机译:X射线光谱元素和荧光X射线分析仪

摘要

PROBLEM TO BE SOLVED: To provide an X-ray spectroscopy element and the like, capable of producing primary X-rays in which integrated intensity is sufficiently high and properly monochronized.;SOLUTION: The X-ray spectroscopic element 4 is used for irradiating primary X-rays 5 to a sample 1 by separating X-rays 2, generating from an X-ray source 3 into spectrum in fluorescent X-ray analysis and is constituted, by layering a multitude of layer pairs consisting of a reflection layer 4a and a spacer layer 4b on a substrate 4c. A plurality of multiple layer films 4e, consisting of a single or a plurality of layer pairs having a specific period length (d), are provided. The closer the substrate 4c is set to the multiple layer film 4e, the smaller the specific period length (d) is set.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种X射线能谱元件等,该X射线能谱元件等能够产生初始X射线,在该X射线能谱中,积分强度足够高并且适当地单次同步化。样品1的X射线5是通过将X射线源3产生的X射线2分离到荧光X射线分析中的光谱中而构成的,它是通过将由反射层4a和a衬底4c上的隔离层4b。提供了由具有特定周期长度(d)的单个或多个层对组成的多个多层膜4e。基板4c离多层膜4e越近,规定的周期长度(d)越小。COPYRIGHT:(C)2003,JPO

著录项

  • 公开/公告号JP2003255089A

    专利类型

  • 公开/公告日2003-09-10

    原文格式PDF

  • 申请/专利权人 RIGAKU INDUSTRIAL CO;

    申请/专利号JP20020058659

  • 发明设计人 YAMADA TAKASHI;DOUI MAKOTO;

    申请日2002-03-05

  • 分类号G21K1/06;G01N23/223;G21K5/02;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:14

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