首页> 外国专利> Semiconductor wafer, method of manufacturing semiconductor wafer having bumps, semiconductor chip having bumps and method of manufacturing the same, semiconductor device, circuit board, and electronic equipment

Semiconductor wafer, method of manufacturing semiconductor wafer having bumps, semiconductor chip having bumps and method of manufacturing the same, semiconductor device, circuit board, and electronic equipment

机译:半导体晶片,具有凸块的半导体晶片的制造方法,具有凸块的半导体芯片及其制造方法,半导体装置,电路基板以及电子设备

摘要

A semiconductor wafer includes a plurality of monolithic integrated circuits formed in a semiconductor crystal for realizing a function of a plurality of semiconductor chips; a plurality of pads formed in a plurality of first regions to be the plurality of semiconductor chips; and a conductor formed in a layer lower than the pads through a second region, which is located between two of the first regions, and electrically connecting at least two of the pads.
机译:一种半导体晶片,包括形成在半导体晶体中的多个单片集成电路,以实现多个半导体芯片的功能;在多个第一区域中形成的多个焊盘成为多个半导体芯片;导体通过第二区域形成在低于焊盘的层中,该第二区域位于两个第一区域之间,并且电连接至少两个焊盘。

著录项

  • 公开/公告号US2003080422A1

    专利类型

  • 公开/公告日2003-05-01

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORPORATION;

    申请/专利号US20020268835

  • 发明设计人 HIROSHI OHARA;

    申请日2002-10-11

  • 分类号H01L23/48;

  • 国家 US

  • 入库时间 2022-08-22 00:09:26

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