Low power test circuit and a semiconductor integrated circuit with the low power test circuit

摘要

A low power test circuit and a semiconductor integrated circuit are provided, i.e., the low power test circuit comprises a first stage single phase scan flip flop, a second stage single phase scan flip flop, a delay element located between an output terminal of the first stage single phase scan flip flop and an input terminal of the second stage single phase scan flip flop, a gate circuit connected between the output terminal of the first stage single phase scan flip flop and the delay element, and the gate circuit transferring scan data from the output terminal of the first stage single phase scan flip flop to the delay element in a scanning test mode thus reducing power dissipation in the delay element. The semiconductor integrated circuit comprises a shift register comprising a plurality of single phase scan flip flop serially connected and the low power test circuit.