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Logic gate circuit with low sub-threshold leakage current

机译:具有低亚阈值泄漏电流的逻辑门电路

摘要

The present invention relates to a logic gate circuit capable of reducing sub-threshold leakage current by applying the reverse voltage to the gate of a turned-off MOS device. The logic gate circuit in accordance with the present invention includes a CMOS logic gate having PMOS devices and NMOS devices with a low threshold voltage, a first voltage generator applying a first reverse voltage to the PMOS device of the CMOS logic gate during a pull-down operation, and a second voltage generator outputting a second reverse voltage to the NMOS device of the CMOS logic gate during a pull-up operation. The first voltage generator outputs a voltage greater than the source voltage by the threshold voltage to the first MOS device when the second MOS device performs a pull-down operation, and the second voltage generator outputs a voltage smaller than the earth voltage by the threshold voltage when the first MOS device performs a pull-up operation.
机译:逻辑门电路技术领域本发明涉及一种逻辑门电路,其能够通过将反向电压施加到截止的MOS器件的栅极来减小亚阈值泄漏电流。根据本发明的逻辑门电路包括具有PMOS器件和具有低阈值电压的NMOS器件的CMOS逻辑门,第一电压发生器在下拉期间向CMOS逻辑门的PMOS器件施加第一反向电压第二电压发生器在上拉操作期间将第二反向电压输出到CMOS逻辑门的NMOS器件。当第二MOS器件执行下拉操作时,第一电压发生器向第一MOS器件输出比源电压高出阈值电压的电压,并且第二电压发生器输出比地电压低出阈值电压的电压。当第一MOS器件执行上拉操作时。

著录项

  • 公开/公告号US6535021B1

    专利类型

  • 公开/公告日2003-03-18

    原文格式PDF

  • 申请/专利权人 HYUNDAI ELECTRONICS INDUSTRIES CO. LTD.;

    申请/专利号US20000630658

  • 发明设计人 SANG HURN SONG;

    申请日2000-08-01

  • 分类号H03K192/00;H03K190/94;

  • 国家 US

  • 入库时间 2022-08-22 00:06:23

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