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Semiconductor memory device operating in low power supply voltage and low power consumption

机译:在低电源电压和低功耗下工作的半导体存储器件

摘要

A semiconductor memory device capable of saving power supply voltage and power consumption without increasing the forming area of memory cell array by using MTCMOS technology. In writing data in a memory cell 50-21, a signal RE is turned “H” level, an NMOS 61-1 is turned off and a virtual ground line VGND1 is turned into floating state. When the signal RE is “H” level, the output level of an AND circuit 64-2 turns “L” level and NMOS 55a and 55b turn off. NMOS 53 and 54 turn on by “H” level of a word line WL2 and data in a bit line pair BL1 and BL/ is held on nodes N11 and N12. In reading out data, the signal RE is turned “L” level. When the NMOS 61-1 turns on and the VGND 1 becomes connected to GND, an acceleration circuit 55 accelerates the speed of readout operation.
机译:通过使用MTCMOS技术,能够节省电源电压和功耗而不增加存储单元阵列的形成面积的半导体存储器件。在将数据写入存储单元 50 - 21中时,信号RE变为“ H”。 NMOS 61 - 1 处于关闭状态,虚拟接地线VGND 1 变为浮置状态。当信号RE为“ H”时电平,AND电路 64 - 2 的输出电平变为“ L”。级别,NMOS 55 a 55 b 关闭。 NMOS 53 54 由“ H”打开;字线WL 2 的电平以及位线对BL 1 和BL /中的数据保持在节点N 11 和N 12。 在读出数据时,信号RE变为“ L”。水平。当NMOS 61 - 1 接通并且VGND 1 变为GND时,加速电路 55 加速读取操作的速度。

著录项

  • 公开/公告号US6643173B2

    专利类型

  • 公开/公告日2003-11-04

    原文格式PDF

  • 申请/专利权人 OKI ELECTRIC INDUSTRY CO. LTD.;

    申请/专利号US20020106218

  • 发明设计人 TAKASHI TAKEMURA;

    申请日2002-03-27

  • 分类号G11C160/40;

  • 国家 US

  • 入库时间 2022-08-22 00:04:33

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