首页> 外国专利> A MULTI-STAGE ARSENIC DOPING PROCESS TO ACHIEVE LOW RESISTIVITY IN SILICON CRYSTAL GROWN BY CZOCHRALSKI METHOD

A MULTI-STAGE ARSENIC DOPING PROCESS TO ACHIEVE LOW RESISTIVITY IN SILICON CRYSTAL GROWN BY CZOCHRALSKI METHOD

机译:Czochralski法实现硅晶体低电阻率的多阶段砷掺杂工艺

摘要

The present invention is directed to the addition of the arsenic dopant in the melt (melt) in multiple stages by lowering the resistivity of the silicon single crystal resulting from the Czochralski crystal growth process.
机译:本发明涉及通过降低由切克劳斯基(Czochralski)晶体生长过程产生的硅单晶的电阻率,在熔体(熔体)中分多个阶段添加砷掺杂剂。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号