首页> 外国专利> POSITION MEASUREMENT AND ARRANGEMENT METHOD, INSTALLATION REFERENCE ELEMENT DEVICE, POSITION MEASURING DEVICE AND OPTICAL PART

POSITION MEASUREMENT AND ARRANGEMENT METHOD, INSTALLATION REFERENCE ELEMENT DEVICE, POSITION MEASURING DEVICE AND OPTICAL PART

机译:位置测量和布置方法,安装参考元件设备,位置测量设备和光学部件

摘要

PROBLEM TO BE SOLVED: To provide a method and device for measuring a position for accurately three-dimensionally arranging an optical part.;SOLUTION: In the position measurement method, installation reference elements 20 are accurately arranged on a bread-board by using straight edge rulers 30, 31 and fixing clamps 32. The junction parts 21 of the bottom faces of the installation reference elements 20 are made of an elastically deformable material so as not to be influenced by the irregularities of the bread-board. Then, it becomes possible to accurately arrange optical parts by attaching a position measuring device to the reference position elements 20. Positioning accuracy of 10 μm is realizable by using an inexpensive measuring device for general use such as a micrometer and slide calipers. The positioning accuracy is 30 times accurate to 300 μm surface irregularities of an optical surface plate, and adjusting time is reduced accordingly.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种用于精确地三维地布置光学部件的位置测量方法和装置。解决方案:在位置测量方法中,通过使用直边将安装参考元件20精确地布置在面包板上。直尺30、31和固定夹32。安装基准元件20的底面的接合部分21由可弹性变形的材料制成,从而不受面包板不平度的影响。然后,通过将位置测量装置附接到基准位置元件20,可以精确地布置光学部件。通过使用诸如千分尺和游标卡尺的通用的廉价测量装置,可以实现10μm的定位精度。定位精度是光学平台的300μm表面不规则度的30倍精度,并且相应地减少了调整时间。版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2004302221A

    专利类型

  • 公开/公告日2004-10-28

    原文格式PDF

  • 申请/专利号JP20030096172

  • 发明设计人 ITAYA TARO;

    申请日2003-03-31

  • 分类号G02B7/00;G01B21/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:33:57

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号