METHOD FOR TESTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE CONSTITUTED TESTABLE USING THE METHOD, METHOD FOR TESTING SEMICONDUCTOR MEMORY, AND THE SEMICONDUCTOR MEMORY CONSTITUTED TESTABLE USING THE METHOD

摘要

PROBLEM TO BE SOLVED: To provide a method for testing a semiconductor device, by which a precise test corresponding to an actual using state can be performed to an accelerated semiconductor device, even if using a testing device of slow operation which is used conventionally.;SOLUTION: By a method for testing the semiconductor device (1) for testing the operation of the semiconductor device (1) and an internal circuit (2) using an external synchronization signal (S1) and an external input signal (S3) to be applied from the outside of the semiconductor device (1), the external synchronization signal (S1) is multiplied to be converted into an internal synchronization signal (S2); the external input signal (S3) is converted to an internal input signal (S4); and the operation of the internal circuit (2) is tested, by using these internal synchronization signal (S2) and the internal input signal (S4).;COPYRIGHT: (C)2004,JPO