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Dry isotropy removal of inorganic acid resisting coating after the poly- gate etching

机译:多晶硅栅刻蚀后干法各向同性去除无机耐酸涂层

摘要

Conductor structure (10) the various methods of producing are offered. In one aspect, the 1st work piece (12) conductor structure (10) the method of producing is offered on. The silicon membrane (20) the 1st work piece (12) it is formed on. Acid resisting coating (22) the silicon membrane (20) it is formed on. The mask (24) acid resisting coating (22) it is formed on the 1st part, as for the 2nd part of acid resisting coating the mask do, it is left. Acid resisting coating (22) the 2nd part and the silicon membrane (20) is etched. The mask (24) is removed, acid resisting coating (22) is removed by isotropy plasma etching. With the use of isotropy etching for acid resisting coating removal, the thermal shock which accompanies hot acid tank acid resisting coating removal is cancelled.
机译:提供了导体结构(10)的各种生产方法。一方面,提供一种制造方法,该第一工件(12)导体结构(10)。在其上形成有第一工件(12)的硅膜(20)。在其上形成的硅膜(20)的耐酸涂层(22)。在第一部分上形成掩模(24)的耐酸涂层(22),在第二部分上留下掩模(22)的耐酸涂层。第二部分的耐酸涂层(22)和硅膜(20)被蚀刻。去除掩模(24),通过各向同性等离子体蚀刻去除耐酸涂层(22)。通过使用各向同性蚀刻进行耐酸涂层的去除,消除了伴随热酸槽耐酸涂层去除的热冲击。

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