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Pressure-contact type semiconductor device

机译:压接型半导体器件

摘要

Provided a pressure-contact type semiconductor device including: a plurality of semiconductor chips; a heat buffer plate provided on one surface side of the plural semiconductor chips; and a metal electrode plate provided on the heat buffer plate on a side opposite the plural semiconductor chips, a surface thereof at any position not facing the plural semiconductor chips on the heat buffer plate side having a region which alleviates elastic deformation of the heat buffer plate. Also provided is a pressure-contact type semiconductor device including: a plurality of semiconductor chips; a heat buffer plate provided on one surface side of the plural semiconductor chips; and a metal electrode plate provided on the heat buffer plate on a side opposite the plural semiconductor chips, a peripheral shape thereof extending beyond and thus being larger than a peripheral shape of the heat buffer plate.
机译:提供了一种压接型半导体装置,其包括:多个半导体芯片;以及多个半导体芯片。热缓冲板设置在多个半导体芯片的一个表面侧上;在热缓冲板上的与多个半导体芯片相反的一侧上的金属电极板,在与热缓冲板侧的多个半导体芯片不对置的任意位置的表面具有减轻热缓冲板的弹性变形的区域。 。还提供了一种压力接触型半导体器件,该半导体器件包括:多个半导体芯片;以及多个半导体芯片。热缓冲板设置在多个半导体芯片的一个表面侧上;金属电极板和设置在热缓冲板上与多个半导体芯片相对的一侧的金属电极板,其外围形状延伸超过热缓冲板的外围形状并因此大于热缓冲板的外围形状。

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