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METHOD FOR FABRICATING GALLIUM NITRIDE SUBSTRATE TO RESTRICT DISLOCATION

机译:一种制造氮化镓基物限制位错的方法

摘要

PURPOSE: A method for fabricating a gallium nitride substrate is provided to reduce a junction area between a sapphire substrate and a chemical compound semiconductor by forming a gallium nitride layer having a void on the sapphire substrate. CONSTITUTION: A gallium nitride buffer layer having a void is grown according to the first reaction volume ratio of gallium and nitrogen on a sapphire substrate under the first temperature. The first gallium nitride layer is grown according to the second reaction volume ratio of gallium and nitrogen on the sapphire substrate under the second temperature. The second temperature is higher than the first temperature. The second gallium nitride layer is grown according to the third reaction volume ratio of gallium and nitrogen on the sapphire substrate under the second temperature.
机译:目的:提供一种用于制造氮化镓衬底的方法,以通过在蓝宝石衬底上形成具有空隙的氮化镓层来减小蓝宝石衬底与化合物半导体之间的接合面积。组成:具有空隙的氮化镓缓冲层是根据在第一温度下蓝宝石衬底上镓和氮的第一反应体积比而生长的。在第二温度下,根据蓝宝石衬底上的镓和氮的第二反应体积比,生长第一氮化镓层。第二温度高于第一温度。在第二温度下,根据蓝宝石衬底上镓和氮的第三反应体积比,生长第二氮化镓层。

著录项

  • 公开/公告号KR20040078211A

    专利类型

  • 公开/公告日2004-09-10

    原文格式PDF

  • 申请/专利权人 LG ELECTRONICS INC.;

    申请/专利号KR20030013019

  • 发明设计人 CHO MYEONG HWAN;LEE HYEON JAE;

    申请日2003-03-03

  • 分类号H01L21/18;

  • 国家 KR

  • 入库时间 2022-08-21 22:48:02

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