首页> 外国专利> SPUTTER PROCESS SIMULATION METHOD USING MONTE-CARLO METHOD TO PREDICT TOPOGRAPHY OF SUBSTRATE

SPUTTER PROCESS SIMULATION METHOD USING MONTE-CARLO METHOD TO PREDICT TOPOGRAPHY OF SUBSTRATE

机译:蒙特卡罗法预测底物地形的溅射过程模拟方法

摘要

Purpose: being arranged to predict the geomorphology of a substrate using a sputter process simulation of a Monte Carlo Method, by considering a scattering effect between the calculating of target atoms and target atoms discharge distribution. Construction: a simulator apparatus is on a processor and executes a reset process (201). Processor executes a calculation process. Each processor calculates an entry target information from an input varible (203). Each processor calculates stop force before an ion implantation process is performed (204). Ion implantation process is performed (205). Each processor calculates the track of all atoms (206). Each processor calculates a conflict phenomenon by using chain collision algorithm (207). Injectant ion energy sources are compared with the predetermined energy of target (208). When injectant ion energy sources are less than the predetermined energy of target (209), ion is implanted. The output result of each processor is formed after simulation process completes (210). Output result is sent to a central processing unit (211). The central processing unit processing output result and result of transmission process is to a kind of postprocess systems (212).
机译:目的:通过考虑目标原子计算与目标原子放电分布之间的散射效应,使用蒙特卡洛方法的溅射过程模拟来预测衬底的地貌。构造:模拟器装置在处理器上并且执行重置过程(201)。处理器执行计算过程。每个处理器从输入变量计算输入目标信息(203)。每个处理器在执行离子注入过程之前计算停止力(204)。进行离子注入过程(205)。每个处理器计算所有原子的轨迹(206)。每个处理器通过使用链冲突算法(207)来计算冲突现象。将注入离子能量源与靶标的预定能量进行比较(208)。当注入离子能量源小于靶标(209)的预定能量时,注入离子。在仿真过程完成之后形成每个处理器的输出结果(210)。输出结果被发送到中央处理单元(211)。中央处理单元处理输出结果和传输处理的结果是一种后处理系统(212)。

著录项

  • 公开/公告号KR20040080724A

    专利类型

  • 公开/公告日2004-09-20

    原文格式PDF

  • 申请/专利权人 KIM JIN WOO;WON TAE YOUNG;

    申请/专利号KR20030015680

  • 发明设计人 WON TAE YOUNG;KIM JIN WOO;

    申请日2003-03-13

  • 分类号H01L21/203;

  • 国家 KR

  • 入库时间 2022-08-21 22:47:58

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号