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THIN FILM OXIDE DEPOSITION METHOD FOR PLASMA DISPLAY PANEL CAPABLE OF AVOIDING DAMAGES DUE TO USE OF ION

机译:等离子体显示板能避免离子损伤的薄氧化膜沉积方法

摘要

PURPOSE: A thin film oxide deposition method is provided to prevent damages caused due to use of ion and degradation of vacuum level caused due to increase of O2. CONSTITUTION: A thin film oxide deposition method comprises a step of mounting a substrate in a chamber(700); a step of maintaining the chamber at a vacuum state, and forming O2 atmosphere in the chamber by injecting small amount of O2 gas in the chamber; a step of forming an ionized £O| atmosphere in the chamber by radiating a UV lamp(500) in the chamber and generating ionized £O|; and a step of depositing, on the substrate, the material evaporated from a deposition material source together with the £O| which is dissociated in the ionized £O| atmosphere.
机译:目的:提供一种薄膜氧化物沉积方法,以防止由于使用离子而造成的损坏以及由于O2的增加而导致的真空度降低。组成:一种薄膜氧化物沉积方法,包括将衬底安装在腔室(700)中的步骤;将腔室保持在真空状态,并通过向腔室中注入少量的O 2气体在腔室中形成O 2气氛的步骤;形成电离的£O |的步骤通过在室内辐射紫外线灯(500)并产生电离的£O |来使室内空气充满。在基板上沉积从沉积材料源蒸发的材料以及£O |的步骤。在电离的£O |中解离大气层。

著录项

  • 公开/公告号KR20040082814A

    专利类型

  • 公开/公告日2004-09-30

    原文格式PDF

  • 申请/专利权人 LG ELECTRONICS INC.;

    申请/专利号KR20030017499

  • 发明设计人 JU MIN HO;

    申请日2003-03-20

  • 分类号H01J17/49;

  • 国家 KR

  • 入库时间 2022-08-21 22:47:55

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