首页> 外国专利> METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TO SOLVE STEP DIFFERENCE BETWEEN CELL AND PERIPHERAL REGIONS

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TO SOLVE STEP DIFFERENCE BETWEEN CELL AND PERIPHERAL REGIONS

机译:制造半导体器件以解决细胞和周边区域之间台阶差异的方法

摘要

PURPOSE: A method for manufacturing a semiconductor device is provided to improve uniformity between cell regions and peripheral regions by simultaneously forming a storage node on the cell region and a metal pattern on the peripheral region. CONSTITUTION: A wafer(201) having a transistor is prepared. A bit line contact region and a storage node contact region are simultaneously opened. A bit line contact plug(203a) and a storage node contact plug(203b) are formed by filling a polysilicon layer in the opening. A first insulating layer(204) is formed to expose the bit line contact plug. A bit line(205) is formed to connect the bit line contact plug. A second insulating layer(206) is formed to expose the storage node contact plug and a metal contact of a peripheral region. A storage node pattern(210a) and a metal pattern(210b) of the peripheral region are simultaneously formed.
机译:目的:提供一种用于制造半导体器件的方法,以通过同时在单元区域上形成存储节点和在外围区域上形成金属图案来提高单元区域和外围区域之间的均匀性。组成:准备了一个晶体管的晶圆(201)。同时打开位线接触区和存储节点接触区。通过在开口中填充多晶硅层来形成位线接触塞203a和存储节点接触塞203b。形成第一绝缘层(204)以暴露位线接触塞。形成位线(205)以连接位线接触塞。形成第二绝缘层(206)以暴露存储节点接触塞和外围区域的金属接触。同时形成外围区域的存储节点图案(210a)和金属图案(210b)。

著录项

  • 公开/公告号KR100450036B1

    专利类型

  • 公开/公告日2004-09-14

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR19970029028

  • 发明设计人 KIM HYEONG SEOK;

    申请日1997-06-30

  • 分类号H01L27/108;

  • 国家 KR

  • 入库时间 2022-08-21 22:46:37

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