首页> 外国专利> Electrolytic polishing method and apparatus for using the same in the transmission electron microscopy specimen preparation

Electrolytic polishing method and apparatus for using the same in the transmission electron microscopy specimen preparation

机译:透射电子显微镜试样制备中的电解抛光方法及其使用的装置

摘要

PROBLEM TO BE SOLVED: To prevent the formation of deposits on the surface of a sample.;SOLUTION: In an electrolytic grinding apparatus equipped with a sample 2 for a transmission electron microscope, the electrodes 3 opposed to the sample 2, a grinding fluid supply means 5 for supplying a grinding fluid 4 to the gaps between the sample 2 and the electrodes 3, an applying means 6 for applying voltage across the sample 2 and the electrodes 3 to grind the sample 2 and a detection means 7 for detecting that the sample 2 becomes predetermined thickness by grinding to stop the grinding fluid supply means 5 and the applying means 6, a bias voltage applying means 8 for applying bias voltage across the sample 2 and the electrodes 3 immediately after the detection means 7 detects that the sample 2 becomes predetermined thickness and a washing liquid supply means 10 for supplying a cleaning fluid 9 to the sample 2 immediately after detection to wash the same are provided.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:为防止在样品表面上形成沉积物;解决方案:在装有用于透射电子显微镜的样品2的电解研磨设备中,电极3与样品2相对,提供研磨液用于向样品2和电极3之间的间隙供应研磨液4的装置5,用于在样品2和电极3之间施加电压以研磨样品2的施加装置6以及用于检测样品2的检测装置7通过研磨以使研磨液供给装置5和施加装置6停止,从而使图2所示的厚度变为预定的厚度,在检测装置7检测到试样2变成样品2之后,在样品2和电极3之间施加偏压的偏压施加装置8。提供预定厚度和清洗液供应装置10,该清洗液供应装置10用于在检测到样本2后立即向样本2供应清洗液9以进行清洗。COPYRIGHT:(C)2001,JPO

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号