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POLISHING HEAD OF CMP APPARATUS TO IMPROVE POLISHING UNIFORMITY OF WAFER AND PREVENT WAFER FROM BEING BROKEN
POLISHING HEAD OF CMP APPARATUS TO IMPROVE POLISHING UNIFORMITY OF WAFER AND PREVENT WAFER FROM BEING BROKEN
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机译:CMP装置的抛光头可改善晶圆和均匀晶圆的打磨均匀性
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摘要
PURPOSE: A polishing head of a CMP(chemical mechanical polishing) apparatus is provided to improve polishing uniformity of a wafer and prevent a wafer from being broken by arranging vacuum holes according to a wafer type. CONSTITUTION: A polishing head(200) of a CMP apparatus absorbs and pressurizes a wafer(100) by using vacuum. A plurality of vacuum holes(200a) are arranged according to a wafer type on the lower surface of the polishing head, separated from each other by a predetermined interval. The interval between the corner part of the wafer and the plurality of vacuum holes is uniformly maintained.
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