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METHOD OF CONTROLLING THRESHOLD VOLTAGE CAPABLE OF BEING VARIED DUE TO SCATTERING OF IONS IN TRANSISTOR USING ION-IMPLANTATION MASK WITH RECESSED PORTION CORRESPONDING TO ION SCATTERED REGION
METHOD OF CONTROLLING THRESHOLD VOLTAGE CAPABLE OF BEING VARIED DUE TO SCATTERING OF IONS IN TRANSISTOR USING ION-IMPLANTATION MASK WITH RECESSED PORTION CORRESPONDING TO ION SCATTERED REGION
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机译:利用离子注入区对应离子散布区域的离子注入面膜控制因晶体管中的离子散射而变化的阈值电压的方法
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摘要
PURPOSE: A method is provided to prevent the variation of a threshold voltage due to scattering of implanted ions by using an ion-implantation mask with a recessed portion corresponding to an ion scattered region. CONSTITUTION: An active region(110) is formed by performing a well ion-implantation on a silicon substrate. A threshold voltage controlling ion-implantation is obliquely performed on the active region by using a mask(116). A gate and a predetermined junction are sequentially formed at the substrate. The mask includes a recessed portion capable of preventing the variation of a threshold voltage due to scattering of implanted ions.
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