首页> 外国专利> METHOD OF CONTROLLING THRESHOLD VOLTAGE CAPABLE OF BEING VARIED DUE TO SCATTERING OF IONS IN TRANSISTOR USING ION-IMPLANTATION MASK WITH RECESSED PORTION CORRESPONDING TO ION SCATTERED REGION

METHOD OF CONTROLLING THRESHOLD VOLTAGE CAPABLE OF BEING VARIED DUE TO SCATTERING OF IONS IN TRANSISTOR USING ION-IMPLANTATION MASK WITH RECESSED PORTION CORRESPONDING TO ION SCATTERED REGION

机译:利用离子注入区对应离子散布区域的离子注入面膜控制因晶体管中的离子散射而变化的阈值电压的方法

摘要

PURPOSE: A method is provided to prevent the variation of a threshold voltage due to scattering of implanted ions by using an ion-implantation mask with a recessed portion corresponding to an ion scattered region. CONSTITUTION: An active region(110) is formed by performing a well ion-implantation on a silicon substrate. A threshold voltage controlling ion-implantation is obliquely performed on the active region by using a mask(116). A gate and a predetermined junction are sequentially formed at the substrate. The mask includes a recessed portion capable of preventing the variation of a threshold voltage due to scattering of implanted ions.
机译:目的:提供一种方法,以通过使用具有与离子散射区域相对应的凹入部分的离子注入掩模来防止由于注入的离子的散射而引起的阈值电压的变化。组成:有源区(110)是通过在硅衬底上进行阱离子注入而形成的。通过使用掩模(116),在有源区上倾斜地执行控制离子注入的阈值电压。在基板上依次形成栅极和预定结。掩模包括能够防止由于注入的离子的散射而引起的阈值电压的变化的凹部。

著录项

  • 公开/公告号KR20050003299A

    专利类型

  • 公开/公告日2005-01-10

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20030044019

  • 发明设计人 KIM SUNG CHUL;

    申请日2003-06-30

  • 分类号H01L21/265;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:03

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