首页> 外国专利> BURIED GATE AND METHOD FOR FORMING THE SAME IMPROVING SHORT MARGIN OR LEAKAGE MARGIN BY FORMING NONCONDUCTIVE SPACER

BURIED GATE AND METHOD FOR FORMING THE SAME IMPROVING SHORT MARGIN OR LEAKAGE MARGIN BY FORMING NONCONDUCTIVE SPACER

机译:埋入式门和通过形成非导电间隔形成相同的改善短边距或泄漏边距的方法

摘要

Purpose: a buried gate and a kind of method, be used to form it is identical be arranged to improve it is short while or when leakage, pass through and form an opaque gasket between buried gate and an effective area. Construction: semi-conductive substrate (100) is provided. One effective area by forming a bar ditch (200) definition on a semiconductor substrate. The non-conductive layers for burying ditch is formed. The inner sidewall that one gasket (300a) is formed in ditch by partly removing non-conductive layers. The device separation layer for burying ditch is formed. One negative film is by making the recessed formation of device separation layer. The conductor layer for burying negative film is formed.
机译:目的:一种掩埋栅和一种方法,用于形成相同的布置以改善其在泄漏时或泄漏时短时通过并在掩埋栅与有效区域之间形成不透明的垫片的可能性。结构:提供半导体衬底(100)。通过在半导体衬底上形成条沟(200)的定义来形成一个有效区域。形成用于掩埋沟的非导电层。通过部分地去除不导电层而在沟中形成一个垫圈(300a)的内侧壁。形成用于掩埋沟的器件分离层。一个负片是通过凹进形成器件隔离层而形成的。形成用于掩埋负膜的导体层。

著录项

  • 公开/公告号KR20050013397A

    专利类型

  • 公开/公告日2005-02-04

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030052028

  • 发明设计人 PARK JONG CHUL;KWON HYUK JIN;

    申请日2003-07-28

  • 分类号H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:52

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