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A method and apparatus for photoelectrochemical etching of a half conductor sample, in particular made of gallium nitride

机译:一种用于光电化学刻蚀特别是由氮化镓制成的半导体样品的方法和设备

摘要

A method for photoelectrochemical etching of a half conductor sample (12), preferably made of gallium nitride,• in the case of which the half conductor sample (12) is brought into contact with an electrolyte - liquid (6),• in the case of the contact surface (14) of the half conductor sample (12) by which means the electrolyte - liquid (6) with uv - light (18) is irradiated,• and in which the in the case of the uv - light - irradiation at the contact surface (14) resulting photocurrent (i) is measured,characterized by the,• that the contact surface (14) during the etching process on the said half conductor sample (12) is repeated a beam (25) of fresh electrolyte - liquid (6) is exposed to, and in that the contact surface (14) is repeated for a predetermined time (t1) with the uv - light (18) is irradiated, wherein in each case in a waiting time (t) between two uv - light - irradiations, the delivery of the electrolyte - liquid - beam (25) is carried out.
机译:一种对半导体样品(12)进行光电化学蚀刻的方法,最好由氮化镓制成;•在这种情况下,使半导体样品(12)与电解质-液体(6)接触;•对半导体样品(12)的接触面(14)进行辐照,用这种方法辐照具有uv-光(18)的电解质-液体(6),•在使用uv-光-辐照的情况下在接触表面(14)处测量得到的光电流(i),其特征在于,•在所述半导体样品(12)上的蚀刻过程中,重复接触表面(14)的是新鲜电解质束(25) -暴露于液体(6),并且用uv将接触表面(14)重复预定的时间(t1)-照射光(18),其中在每种情况下的等待时间(t)为在两次紫外-光-照射下,进行电解质-液体-束(25)的输送。

著录项

  • 公开/公告号DE10256821B4

    专利类型

  • 公开/公告日2005-04-14

    原文格式PDF

  • 申请/专利权人 WOLFF THOMAS 78120 FURTWANGEN DE;

    申请/专利号DE2002156821

  • 发明设计人 GLEICH PATENTINHABER;

    申请日2002-12-04

  • 分类号H01L21/3063;H01L33/00;

  • 国家 DE

  • 入库时间 2022-08-21 22:01:31

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