X-RAY DIFFRACTION ANALYZER AND X-RAY DIFFRACTION ANALYZING METHOD

摘要

PROBLEM TO BE SOLVED: To provide an X-ray diffraction analyzing technique capable of simply acquiring the X-ray diffraction pattern equipped with the local structural data of a sample having a non-uniform crystal structure in a laboratory or on the spot by reducing the damping of intensity in a light path until the X-ray beam emitted from an X-ray tube arrives at a sample to the utmost.;SOLUTION: A position where the X-ray tube (9), which emits characteristic X rays of a predetermined element as incident X rays (8) for illuminating the fixed and held sample (1), is a position permitting the incident X rays (8) to irradiate the whole of the region (A) to be measured of the sample (1) and unlimitedly approaching the sample (1) within the non-contact range with the sample (1).;COPYRIGHT: (C)2006,JPO&NCIPI