首页> 外国专利> EVALUATION METHOD AND MANUFACTURING METHOD FOR SHEET CONTAINING OXIDE POWDER, ELECTRONIC PARTS, AND EVALUATION DEVICE AND MANUFACTURING DEVICE FOR SHEET CONTAINING OXIDE POWDER

EVALUATION METHOD AND MANUFACTURING METHOD FOR SHEET CONTAINING OXIDE POWDER, ELECTRONIC PARTS, AND EVALUATION DEVICE AND MANUFACTURING DEVICE FOR SHEET CONTAINING OXIDE POWDER

机译:含氧化物粉末板料,电子零件的评价方法及制造方法,含氧化物粉末板料的评价装置及制造装置

摘要

PROBLEM TO BE SOLVED: To provide an evaluation method enabling to precisely evaluate a film containing oxide powder, a sheet manufacturing method using the evaluation method, an evaluation device and manufacturing device suitable for the these methods, and ceramic electronic parts with high reliability and productivity.;SOLUTION: This evaluation method comprises a step in which the light intensity of light L passing through the sheet 10 including a film 12 containing predetermined oxide powder is measured by projecting light L with wavelength of λZ to a sheet 10, and a step in which information on either of the weight per unit area or the particle diameter of the oxide powder included in the film 12 is obtained based on the measured light intensity. The wavelength of λZ is at least within the range greater than 900 nm.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种能够精确地评估包含氧化物粉末的膜的评估方法,使用该评估方法的片材制造方法,适用于这些方法的评估装置和制造装置以及具有高可靠性和生产率的陶瓷电子零件解决方案:该评估方法包括以下步骤:通过投射波长为 Z 的光L来测量穿过包含预定氧化物粉末的薄膜12的薄片10的光L的光强度。然后,将其送至片材10上,并根据测得的光强度获得关于膜12中所含的氧化物粉末的每单位面积重量或粒径的信息。 λ Z 的波长至少在大于900 nm的范围内。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2005321297A

    专利类型

  • 公开/公告日2005-11-17

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20040139589

  • 发明设计人 IGAKI EMIKO;ICHINOSE TAKESHI;

    申请日2004-05-10

  • 分类号G01N21/35;B28B1/30;G01B11/08;G01N21/59;H01G4/12;H01G4/30;

  • 国家 JP

  • 入库时间 2022-08-21 21:53:55

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