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Integrated circuit including a high voltage LDMOS device and low voltage devices

机译:包括高压LDMOS器件和低压器件的集成电路

摘要

An integrated circuit includes a high voltage LDMOS device and a low voltage device. The LDMOS device includes a lightly doped p-well as the drift region of the drain terminal while low voltage devices are built using standard, more heavily doped p-wells. By using a process including a lightly doped p-well and a standard p-well, high and low voltage devices can be integrated onto the same integrated circuit. In one embodiment, the lightly doped p-well and the standard p-well are formed by performing ion implantation using a first dose to form the lightly doped p-well, masking the lightly doped p-well, and performing ion implantation using a second dose to form the standard p-well. The second dose is the difference of the dopant concentrations of the lightly doped p-well and the standard p-well. In other embodiments, other high voltage devices can also be built by incorporating the lightly doped p-well structure.
机译:集成电路包括高压LDMOS器件和低压器件。 LDMOS器件包括一个轻掺杂的p阱作为漏极端子的漂移区,而低压器件则使用标准的,重掺杂的p阱构建。通过使用包括轻掺杂p阱和标准p阱的工艺,高低压器件可以集成到同一集成电路上。在一个实施例中,通过使用第一剂量执行离子注入以形成轻掺杂p阱,掩蔽轻掺杂p阱并使用第二剂量执行离子注入来形成轻掺杂p阱和标准p阱。剂量以形成标准p孔。第二剂量是轻掺杂p阱和标准p阱的掺杂剂浓度之差。在其他实施例中,还可以通过结合轻掺杂的p阱结构来构建其他高压器件。

著录项

  • 公开/公告号US2005253216A1

    专利类型

  • 公开/公告日2005-11-17

    原文格式PDF

  • 申请/专利权人 HIDEAKI TSUCHIKO;

    申请/专利号US20050189173

  • 发明设计人 HIDEAKI TSUCHIKO;

    申请日2005-07-25

  • 分类号H01L23/58;

  • 国家 US

  • 入库时间 2022-08-21 21:45:58

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