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Method of improving data retention ability of semiconductor memory device, and semiconductor memory device

机译:改善半导体存储器件的数据保持能力的方法和半导体存储器件

摘要

This invention is a method of improving a data retention ability of a semiconductor memory device having a plurality of nonvolatile memory cells storing a plurality of memory states. The method includes the steps of: (a) selecting the nonvolatile memory cells in a first memory group each of which accumulates charges higher in level than a first threshold from the plurality of nonvolatile memory cells; (b) extracting the nonvolatile memory cells in a first sub-group each of which accumulates the charges lower in level than a second threshold from the nonvolatile memory cells in the first memory group; and (c) programming the nonvolatile memory cells in the first sub-group until each of the nonvolatile memory cells accumulates the charges higher in level than the second threshold.
机译:本发明是一种提高具有多个存储多个存储状态的非易失性存储单元的半导体存储装置的数据保持能力的方法。该方法包括以下步骤:(a)从多个非易失性存储单元中选择第一存储组中的每个非易失性存储单元,这些非易失性存储单元所累积的电荷的电平高于第一阈值; (b)从第一存储组中的非易失性存储单元中提取第一子组中的非易失性存储单元,每个第一子组中累积的电荷的水平低于第二阈值; (c)对第一子组中的非易失性存储单元进行编程,直到每个非易失性存储单元累积的电荷的电平高于第二阈值。

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