NONVOLATILE SEMICONDUCTOR MEMORY DEVICE CAPABLE OF CHECKING PASS/FAIL STATUS

摘要

The present invention relates to a nonvolatile semiconductor memory device.; The present invention has a memory cell array; The page buffer circuit; in a semiconductor memory device including, each of the page buffer page of the first register and the second comprises a register, the first data bit of the register to pass / fail check to determine if the path data, circuit; Using the determination result of the pass / fail check circuit, the n number of page all that is continuously program determines whether the successfully programmed, and pass / fail check latch circuit for storing the determination resu characterized by further including do.; According to the present invention, even if the fail-page is one of all the pages of the program when the program more than one page in succession can be checked whether or not there.