首页> 外国专利> METHOD OF FABRICATING NITRIDE TYPE COMPOUND LAYER, GAN SUBSTRATE AND VERTICAL STRUCTURE NITRIDE TYPE SEMICONDUCTOR LIGHT EMITTING DEVICE

METHOD OF FABRICATING NITRIDE TYPE COMPOUND LAYER, GAN SUBSTRATE AND VERTICAL STRUCTURE NITRIDE TYPE SEMICONDUCTOR LIGHT EMITTING DEVICE

机译:制造氮化物型复合层,gan基质和垂直结构氮化物型半导体发光器件的方法

摘要

A method for fabricating a nitride-based compound layer is provided to recycle an expensive GaN substrate by separating a GaN substrate without damage by a wet etch process. A mask layer(22) is formed on a GaN substrate(21), having a predetermined pattern for exposing a part of the upper surface of the GaN substrate. A buffer layer(23) is formed on the upper surface of the exposed GaN substrate, made of a material having a difference of a lattice constant of 10 percent or lower with respect to GaN. After a nitride-based compound layer(24) is laterally grown from the upper surface of the buffer layer to the upper surface of the mask layer, a predetermined thickness of a nitride-based compound layer is vertically grown. The mask layer and the buffer layer are eliminated by a wet etch process to separate the GaN substrate and the nitride-based compound layer from each other. The buffer layer is made of at least one material selected from a group composed of ZnO, Ga2O3 and ZrB2. The mask layer is a silicon oxide layer or a silicon nitride layer.
机译:提供了一种用于制造氮化物基化合物层的方法,以通过分离GaN衬底来回收昂贵的GaN衬底,而不会受到湿蚀刻工艺的损害。在GaN衬底(21)上形成具有预定图案的掩模层(22),该预定图案用于暴露GaN衬底的上表面的一部分。在暴露的GaN衬底的上表面上形成缓冲层(23),该缓冲层由相对于GaN具有10%或更低的晶格常数差的材料制成。在从缓冲层的上表面到掩模层的上表面横向生长氮化物基化合物层(24)之后,垂直地生长预定厚度的氮化物基化合物层。通过湿蚀刻工艺去除掩模层和缓冲层,以将GaN衬底和氮化物基化合物层彼此分离。缓冲层由选自由ZnO,Ga 2 O 3和ZrB 2组成的组中的至少一种材料制成。掩模层是氧化硅层或氮化硅层。

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