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The device has a flash memory and 1995 for programming of the bits of clinical and for the read

机译:该设备有一个闪存,1995年用于临床位的编程和读取。

摘要

The device has a voltage supply circuit (270) providing high and low voltages to word lines. A voltage supply circuit (240) provides high voltage, during one period, to bit lines conforming to a least significant bit (LSB), to program and read the LSB before another period. The circuit (240) provides low voltage to the bit lines conforming to a most significant bit (MSB) and read LSB at the latter period, to program the MSB. An independent claim is also included for a process for programming the least and most significant bits in cells of a memory during two different programming periods.
机译:该装置具有向字线提供高电压和低电压的电压供应电路(270)。电压供应电路(240)在一个周期内向符合最低有效位(LSB)的位线提供高电压,以在另一周期之前对LSB进行编程和读取。电路(240)向符合最高有效位(MSB)的位线提供低电压,并在后一周期读取LSB,以对该MSB进行编程。还包括针对在两个不同的编程周期期间对存储器的单元中的最低和最高有效位进行编程的过程的独立权利要求。

著录项

  • 公开/公告号FR2857495B1

    专利类型

  • 公开/公告日2006-07-14

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO LTD;

    申请/专利号FR20040007709

  • 发明设计人 LEE YEONG TAEK;KIM DONG HWAN;

    申请日2004-07-09

  • 分类号G11C7/10;G11C16/06;G11C11/56;G11C16/02;G11C16/04;G11C16/30;

  • 国家 FR

  • 入库时间 2022-08-21 21:17:35

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