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Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing

机译:双向分裂栅NAND闪存结构和阵列,其编程,擦除和读取方法以及制造方法

摘要

A split gate NAND flash memory structure is formed on a semiconductor substrate of a first conductivity type. The NAND structure comprises a first region of a second conductivity type and a second region of the second conductivity type in the substrate, spaced apart from the first region, thereby defining a channel region therebetween. A plurality of floating gates are spaced apart from one another and each is insulated from the channel region. A plurality of control gates are spaced apart from one another, with each control gate insulated from the channel region. Each of the control gate is between a pair of floating gates and is capacitively coupled to the pair of floating gates. A plurality of select gates are spaced apart from one another, with each select gate insulated from the channel region. Each select gate is between a pair of floating gates.
机译:在第一导电类型的半导体衬底上形成分裂栅NAND闪存结构。 NAND结构在基板中包括第二导电类型的第一区域和第二导电类型的第二区域,与第一区域间隔开,从而在其之间限定沟道区域。多个浮栅彼此间隔开,并且每个浮栅与沟道区绝缘。多个控制栅极彼此间隔开,每个控制栅极与沟道区域绝缘。每个控制栅都在一对浮栅之间,并且电容耦合到该对浮栅。多个选择栅彼此间隔开,每个选择栅与沟道区绝缘。每个选择栅都在一对浮动栅之间。

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