首页> 外国专利> Semiconductor nonvolatile memory, method of recording data in the semiconductor nonvolatile memory and method of reading data from the semiconductor nonvolatile memory

Semiconductor nonvolatile memory, method of recording data in the semiconductor nonvolatile memory and method of reading data from the semiconductor nonvolatile memory

机译:半导体非易失性存储器,在半导体非易失性存储器中记录数据的方法以及从半导体非易失性存储器读取数据的方法

摘要

A memory cell structure and control of the memory operation are simplified, and the cost of production is decreased, by way of a semiconductor nonvolatile memory having a transistor including a gate electrode provided on a p-type semiconductor substrate via a gate insulating film, and a source region and a drain region, which are a pair of n-type impurity diffusion regions in the surface layer region of the semiconductor substrate at positions sandwiching the gate electrodes therebetween. A first resistance-varying portion and a second resistance-varying portion are sandwiched by the source region, drain region and channel-forming region. The n-type impurity concentration in the resistance-varying portions is lower than in the source and drain regions.
机译:通过具有包括经由栅绝缘膜设置在p型半导体衬底上的栅电极的晶体管的半导体非易失性存储器,简化了存储器单元的结构和存储器操作的控制,并且降低了生产成本。源区和漏区是在半导体衬底的表层区域中的在其间夹着栅电极的位置处的一对n型杂质扩散区。第一电阻变化部分和第二电阻变化部分被源极区,漏极区和沟道形成区夹在中间。电阻变化部分中的n型杂质浓度低于源极和漏极区域中的n型杂质浓度。

著录项

  • 公开/公告号US7211878B2

    专利类型

  • 公开/公告日2007-05-01

    原文格式PDF

  • 申请/专利权人 TAKASHI ONO;

    申请/专利号US20030739215

  • 发明设计人 TAKASHI ONO;

    申请日2003-12-19

  • 分类号H01L23/58;

  • 国家 US

  • 入库时间 2022-08-21 21:00:37

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号