首页> 外国专利> PROCESS APPARATUS AND METHOD FOR IMPROVING PLASMA DISTRIBUTION AND PERFORMANCE IN AN INDUCTIVELY COUPLED PLASMA

PROCESS APPARATUS AND METHOD FOR IMPROVING PLASMA DISTRIBUTION AND PERFORMANCE IN AN INDUCTIVELY COUPLED PLASMA

机译:改善电感耦合等离子体中等离子体分布和性能的过程装置和方法

摘要

A processing system (12) for processing a substrate (18) with a plasma (28) comprises a processing chamber (13) defining a processing space (14) and including a substrate support (17) therein for supporting a substrate (18) in the processing space (14) and a gas inlet (20) for introducing a process gas into said processing space (14). A plasma source is operable for creating a plasma (28) in the processing space (14) from process gas introduced therein. The plasma source comprises a dielectric window (24a) which interfaces with the processing chamber (12) proximate the processing space (14) and an inductive element (10) positioned outside of the chamber (12) and proximate the dielectric window (24a). The inductive element (10) is operable for coupling electrical energy through the dielectric window (24a) and into the processing space (14) to create a plasma (28) therein and comprises a variety of alternative designs for providing a dense, uniform plasma. IMAGE
机译:用于用等离子体(28)处理基板(18)的处理系统(12)包括处理腔室(13),该处理腔室(13)限定了处理空间(14),并且在其中包括用于支撑基板(18)的基板支撑件(17)。处理空间(14)和用于将处理气体引入所述处理空间(14)的气体入口(20)。等离子体源可操作用于从引入其中的处理气体在处理空间(14)中产生等离子体(28)。等离子体源包括介电窗(24a),其在处理空间(14)附近与处理室(12)对接;以及感应元件(10),其定位在处理室(12)的外部并在介电窗(24a)附近。感应元件(10)可操作用于通过介电窗(24a)耦合电能并进入处理空间(14)以在其中形成等离子体(28),并且包括用于提供密集,均匀等离子体的多种替代设计。 <图像>

著录项

  • 公开/公告号KR100712762B1

    专利类型

  • 公开/公告日2007-05-02

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20017012294

  • 发明设计人 브르카조세프;콘솔리폴루이스;

    申请日2001-09-26

  • 分类号H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 20:32:18

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