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Even adjustment, the end of a process for the preparation of a double - gate mosfet, as well as produced by the method of double - gate mosfet

机译:甚至进行调整,结束双闸极mosfet的制备过程,以及通过双闸极mosfet的方法生产的

摘要

A process for the preparation of a double - gate - mosfet comprising the steps of:(a) forming a first insulator layer (4) on a layer structure, comprising a carrier substrate (1), a semiconductor layer (3) is arranged between them, as well as a buried layer (2),(b) formation of a protective layer (5) formed on the first insulator layer (4),(c) production of a mesa structure (1, 2a, 3a, 4a, 5a) by means of machining of the layer structure (1, 2, 3, 4, 5) to the surface of the carrier substrate for the fixing of the width of the source - and drain regions in the double - gate - mosfet,(d) selective, lateral under-etching of the first insulator layer (4a) is formed and the buried layer (2a),(e) selective removal of the protective layer (5a),(f) preparation of the source - - and drain regions (3b) as well as the channel layer (3c) in the semiconductor layer (3),(g) forming a second insulator layer (6) on the existing layer structure (1, 2b, 3b and 3c, 4b),(h) forming an opening in the mesa structure, with a depth up to the carrier substrate (1) or to..
机译:一种双栅MOSFET的制备方法,包括以下步骤:(a)在包括载体衬底(1)的层结构上形成第一绝缘体层(4),将半导体层(3)布置在它们之间。它们以及埋层(2),(b)在第一绝缘层(4)上形成的保护层(5)的形成,(c)台面结构(1、2a,3a,4a, 5a)通过将层结构(1、2、3、4、5)加工到载体衬底的表面以固定双栅极mosfet中的源极和漏极区域的宽度, d)形成第一绝缘体层(4a)的选择性侧向底蚀,并形成掩埋层(2a),(e)选择性去除保护层(5a),(f)制备源极-和漏极区域(3b)以及半导体层(3),(g)中的沟道层(3c)在现有层结构(1、2b,3b和3c,4b)上形成第二绝缘层(6), h)在台面中形成一个开口结构,深度可达载体基板(1)或。

著录项

  • 公开/公告号DE10208881B4

    专利类型

  • 公开/公告日2007-06-28

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2002108881

  • 发明设计人

    申请日2002-03-01

  • 分类号H01L21/336;H01L21/84;H01L27/12;

  • 国家 DE

  • 入库时间 2022-08-21 20:30:07

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