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Detaching transfer film from semiconductor substrate and for its transfer by dry chemical etching, preferably by gas phase etching using specified doping

机译:从半导体衬底上取下转移膜,并通过干法化学刻蚀(最好通过使用指定掺杂的气相刻蚀)进行转移

摘要

Detaching method for transfer film (20) from semiconductor substrate removes separating film under transfer film doped by specified dopant. For removal of separating film is used dry chemical etching, preferably by gas phase etching. Preferably dopant is applied to separating film by ion implantation. First doped separating film is deposited onto semiconductor substrate followed by transfer film, especially epitaxically. Independent claims are included for semiconductor device and transfer film.
机译:从半导体衬底上去除转移膜(20)的方法去除了在由指定的掺杂剂掺杂的转移膜下的分离膜。为了去除分离膜,使用干法化学蚀刻,优选通过气相蚀刻。优选地,通过离子注入将掺杂剂施加到分离膜上。首先将掺杂的隔离膜沉积在半导体衬底上,然后是转移膜,特别是外延沉积。包括半导体器件和转移膜的独立权利要求。

著录项

  • 公开/公告号DE102005032454A1

    专利类型

  • 公开/公告日2007-01-25

    原文格式PDF

  • 申请/专利权人 ROBERT BOSCH GMBH;

    申请/专利号DE20051032454

  • 发明设计人 SCHELLING CHRISTOPH;LEINENBACH CHRISTINA;

    申请日2005-07-12

  • 分类号H01L21/58;H01L21/3065;H01L29/84;B81C1;B81B1;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:52

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