首页> 外国专利> Interferometric measuring device e.g. Fizeau or Michelson interferometer, for e.g. measuring spherical or aspherical optical surface of test object, has diffractive surfaces that correspond with optical surfaces that are to be measured

Interferometric measuring device e.g. Fizeau or Michelson interferometer, for e.g. measuring spherical or aspherical optical surface of test object, has diffractive surfaces that correspond with optical surfaces that are to be measured

机译:干涉测量设备Fizeau或Michelson干涉仪,例如测量被测物体的球形或非球形光学表面,具有与要测量的光学表面相对应的衍射表面

摘要

The device has an optical unit (102) that comprises a reference surface (103), and a diffractive optical unit (105). The diffractive optical unit comprises two different diffractive structures (112, 113). One of the diffractive surfaces corresponds with an optical surface (107) that is to be measured and another diffractive surface corresponds with another optical surface (109) that is to be measured.
机译:该装置具有光学单元(102),该光学单元包括参考表面(103)和衍射光学单元(105)。衍射光学单元包括两个不同的衍射结构(112、113)。衍射表面之一对应于将被测量的光学表面(107),而另一衍射表面对应于将被测量的另一光学表面(109)。

著录项

  • 公开/公告号DE102005036166A1

    专利类型

  • 公开/公告日2007-02-08

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20051036166

  • 发明设计人 SCHILKE FRANK;HETZLER FRANK;ARNOLD RALF;

    申请日2005-08-02

  • 分类号G01B9/02;G01B9/021;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:49

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