首页> 外国专利> Method for measuring shape of optical surface of test object by measuring device, involves arranging test object on object holder, setting multiple measurement configuration, and interferometric measuring area of optical surface

Method for measuring shape of optical surface of test object by measuring device, involves arranging test object on object holder, setting multiple measurement configuration, and interferometric measuring area of optical surface

机译:一种利用测量装置测量被测物体光学表面形状的方法,包括将被测物体布置在物体支架上,设置多种测量配置,以及光学表面的干涉测量面积

摘要

The method involves arranging a test object (12) on an object holder (18), setting multiple measurement configuration, and interferometric measuring an area (22) of an optical surface (14) in each of the set measurement configuration. The area of the optical surface illuminates a measuring wave (20) which is transmitted from a measuring head (16). A diffractive optical module is configured to apply the effect of a non-spherical mirror surface on a wavefront of the measuring wave during reflection of the measuring wave on diffractive optical module.
机译:该方法包括将测试对象(12)布置在对象保持器(18)上,设置多个测量配置,以及在每个设置的测量配置中干涉测量光学表面(14)的面积(22)。光学表面的区域照亮从测量头(16)发射的测量波(20)。衍射光学模块被配置为在测量波在衍射光学模块上的反射期间在测量波的波前上施加非球面镜面的效果。

著录项

  • 公开/公告号DE102013212492A1

    专利类型

  • 公开/公告日2014-07-03

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号DE201310212492

  • 发明设计人 SCHULTE STEFAN;

    申请日2013-06-27

  • 分类号G01B11/24;G01B11/02;G01B9/02;G01M11;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:10

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