首页> 外国专利> Method for measuring shape of surface of test object, involves measuring thickness distribution of surface layer, and irradiating test beam on surface of test object, overlying reference beam with test beam

Method for measuring shape of surface of test object, involves measuring thickness distribution of surface layer, and irradiating test beam on surface of test object, overlying reference beam with test beam

机译:一种测量被测物体表面形状的方法,包括测量表面层的厚度分布,并在被测物体表面照射测试光束,将参考光束覆盖在测试光束上

摘要

The method involves measuring thickness distribution of a surface layer (16), and irradiating a test beam (26) on a surface (14) of a test object (12), overlying a reference beam with the test beam after reflection of the test beam at the test object. The phase of the reference beam is varied and the intensity distribution generated by the application of the test beam with reference beam of different phase is recorded. The shape of the surface is determined by clearing the applied intensity distribution with the measured thickness distribution of the surface layer. Independent claims are also included for the following: (1) a measuring arrangement for measuring shape of a surface of a test object; and (2) an evaluation device for determining shape of a surface of a test object.
机译:该方法包括测量表面层(16)的厚度分布,并且在测试对象(12)的表面(14)上照射测试束(26),在测试束反射之后用测试束覆盖参考束。在测试对象上。改变参考光束的相位,并记录通过将测试光束与不同相位的参考光束一起施加而产生的强度分布。通过将施加的强度分布与测量的表面层厚度分布清除,可以确定表面的形状。还包括以下方面的独立权利要求:(1)一种用于测量测试对象表面形状的测量装置; (2)用于确定被检体的表面形状的评价装置。

著录项

  • 公开/公告号DE102011086910A1

    专利类型

  • 公开/公告日2012-07-19

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号DE20111086910

  • 发明设计人 DOERBAND BERND;

    申请日2011-11-23

  • 分类号G01B11/24;G01B11/06;G01B9/02;

  • 国家 DE

  • 入库时间 2022-08-21 17:04:50

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