首页> 外国专利> Interferometric testing of curved, spherical and aspherical, reflective surfaces using an interferometer and a diffractive optical element, with the latter generating a reference wave and a measurement wave

Interferometric testing of curved, spherical and aspherical, reflective surfaces using an interferometer and a diffractive optical element, with the latter generating a reference wave and a measurement wave

机译:使用干涉仪和衍射光学元件对弯曲的球面和非球面反射面进行干涉测量,后者产生参考波和测量波

摘要

System for interferometric testing of the surface (1) of a test object (2) uses an interferometer and an optical element (3) with a diffractive structure (4) on its surface. Said structure generates a conjugated reference wave (7) by diffraction of the incident light wave (6). At the same time the structure serves as a null-optics transmission device with a measurement wave (8) generated, transmitted to the test object and then back scattered from the object so that it overlaps and interferes with the reference wave.
机译:用于对测试对象(2)的表面(1)进行干涉测量的系统使用干涉仪和在其表面上具有衍射结构(4)的光学元件(3)。所述结构通过入射光波(6)的衍射产生共轭参考波(7)。同时,该结构用作零光学传输设备,其中生成了测量波(8),该测量波被传输到测试对象,然后从该对象向后散射,从而使其重叠并干扰参考波。

著录项

  • 公开/公告号DE10223581A1

    专利类型

  • 公开/公告日2003-12-18

    原文格式PDF

  • 申请/专利权人 DIOPTIC GMBH;

    申请/专利号DE2002123581

  • 申请日2002-05-28

  • 分类号G01B9/02;G01N21/47;

  • 国家 DE

  • 入库时间 2022-08-21 22:44:12

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