首页> 外国专利> LIFETIME DETECTING METHOD OF MAGNETRON AND ITS LIFETIME DETECTION DEVICE

LIFETIME DETECTING METHOD OF MAGNETRON AND ITS LIFETIME DETECTION DEVICE

机译:磁控管的寿命检测方法及其寿命检测装置

摘要

PPROBLEM TO BE SOLVED: To provide a lifetime detection device of a magnetron capable of detecting a lifetime of the magnetron at a life-ending time as early as possible. PSOLUTION: A lifetime detection device 21 having a wave guide filter for blocking the microwave power of normal oscillation and making the microwave power of abnormal oscillation pass through is provided, and fitted at a wave guide system circuit 18 of microwave power. When the magnetron 17 outputs microwave power generated by the abnormal oscillation, the microwave power of the abnormal oscillation is transmitted from a slot antenna of the wave guide system circuit 18 to the wave guide filter. From the action of an alarm corresponding to the microwave power of a coaxial wire terminal 16 appearing by the reception of the lifetime detection device 21, the life-ending time of the magnetron 17 is notified. PCOPYRIGHT: (C)2008,JPO&INPIT
机译:

要解决的问题:提供一种磁控管的寿命检测装置,该装置能够在寿命尽头的时间尽早检测磁控管的寿命。解决方案:寿命检测装置21设置有波导滤波器,该波导滤波器用于阻挡正常振荡的微波功率并使非正常振荡的微波功率通过,并安装在微波功率的波导系统电路18上。当磁控管17输出由异常振荡产生的微波功率时,异常振荡的微波功率从波导系统电路18的缝隙天线传输到波导滤波器。根据寿命检测装置21的接收,根据与同轴线端子16的微波功率对应的警报的作用,通知磁控管17的寿命结束时间。

版权:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2008218362A

    专利类型

  • 公开/公告日2008-09-18

    原文格式PDF

  • 申请/专利权人 MICRO DENSHI KK;

    申请/专利号JP20070058083

  • 发明设计人 HARADA AKIICHI;

    申请日2007-03-08

  • 分类号H05B6/68;

  • 国家 JP

  • 入库时间 2022-08-21 20:25:46

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