首页> 外国专利> Method for fabricating a wafer level package having through wafer vias for external package connectivity

Method for fabricating a wafer level package having through wafer vias for external package connectivity

机译:具有用于外部封装连接性的具有晶片通孔的晶片级封装的制造方法

摘要

According to an exemplary embodiment, a method for fabricating a wafer level package includes forming a polymer layer on a device wafer, where the device wafer includes at least one device wafer contact pad and a device, and where the at least one device wafer contact pad is electrically connected to the device. The method further includes bonding a protective wafer to the device wafer. The method further includes forming at least one via in the protective wafer, where the at least one via extends through the protective wafer and is situated over the at least one device wafer contact pad. The method further includes forming at least one protective wafer contact pad on the protective wafer, where the at least one protective wafer contact pad is situated over the at least one via and electrically connected to the at least one device wafer contact pad.
机译:根据示例性实施例,一种用于制造晶片级封装的方法包括:在器件晶片上形成聚合物层,其中所述器件晶片包括至少一个器件晶片接触垫和器件,并且其中所述至少一个器件晶片接触垫与设备电连接。该方法还包括将保护晶片结合到器件晶片。该方法还包括在保护晶片中形成至少一个通孔,其中至少一个通孔延伸穿过保护晶片并位于至少一个器件晶片接触垫上方。该方法还包括在该保护晶片上形成至少一个保护晶片接触垫,其中该至少一个保护晶片接触垫位于该至少一个通孔上方并且电连接到该至少一个器件晶片接触垫。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号