首页> 外国专利> TRANSISTOR HAVING SOURCE/DRAIN REGION ONLY UNDER SIDEWALL SPACER EXCEPT FOR CONTACTS AND METHOD

TRANSISTOR HAVING SOURCE/DRAIN REGION ONLY UNDER SIDEWALL SPACER EXCEPT FOR CONTACTS AND METHOD

机译:晶体管的源/漏区仅在侧壁间隔下,但接触和方法除外

摘要

A transistor and related method are disclosed. The transistor may include a gate, a sidewall spacer formed along the gate, and a source/drain region positioned only under the sidewall spacer except for a portion at which a contact is positioned. The transistor may be ultra-low power and sub-threshold voltage or near sub-threshold voltage. The transistor may exhibit at least two times reduction in outer fringe capacitance (Cof).
机译:公开了一种晶体管和相关方法。该晶体管可以包括栅极,沿着该栅极形成的侧壁间隔物,以及仅位于侧壁间隔物下方的,除了接触部所在的部分之外的源极/漏极区域。该晶体管可以是超低功率和亚阈值电压或接近亚阈值电压。晶体管的外部条纹电容(C of )可能至少降低两倍。

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