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Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof
Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof
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机译:利用集成电路之间的至少一个信号的测试方法,集成电路及其测试系统
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摘要
A testing method utilizing at least one signal between ICs includes: coupling at least one testing device to a plurality of ICs that are capable of being tested by the testing device, the ICs including at least a first IC and a second IC; coupling the second IC to the first IC to utilize at least one output signal of the first IC to be at least one input signal of the second IC; and testing the second IC by utilizing the testing device and the output signal of the first IC.
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