Test Procedures and Design Methods for Reliable Large Scale Integrated Circuits and Systems

摘要

The following four major problem areas were investigated in the course of the research supported: (1) procedures to detect faults in random access memories; (2) analysis and design of fault-tolerant computing networks; (3) design of testable microprocessors and iterative logic arrays; and (4) design and analysis of fault-tolerant connection networks. (Author)