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semiconductor memory with reduced fluctuation of writing speed

机译:减少写入速度波动的半导体存储器

摘要

A non-volatile semiconductor memory is comprised of: a memory cell array (11) including a plurality of memory cells which is disposed at intersections of a plurality of bit lines and word lines and are connected to said bit lines; and a writing circuit (15) which receives an address signal (A m , A m-1 , ...) and supplies a bit line voltage (V bit ) to the bit line connected to the memory cell selected with the address signal (A m , A m-1 , ...) during writing operation. The writing circuit (15) changes, based on the address signal (A m , A m-1 , ...) , a level of the bit line voltage (V bit ) depending on a position of the selected memory cell in the memory cell array (11). The writing circuit (15) operates, based on the inputted writing address, to further increase a level of the bit line voltage (V bit ) supplied to the memory cell as the wiring distance via the bit line from the output end of the bit line voltage of the writing circuit (15) thereto is longer, fluctuation of writing speed in each memory cell of a memory cell array is reduced.
机译:一种非易失性半导体存储器,包括:包括多个存储单元的存储单元阵列(11),所述多个存储单元设置在多条位线和字线的交叉处并连接至所述位线;写入电路(15),其接收地址信号(A m,A m-1,...),并将位线电压(V bit)提供给连接到由该地址信号选择的存储单元的位线。 A m,A m-1,...)在写操作期间。写入电路(15)根据地址信号(A m,A m-1,...),根据所选择的存储单元在存储器中的位置来改变位线电压(V bit)的电平。单元阵列(11)。写入电路(15)基于输入的写入地址进行操作,以进一步增加从位线的输出端经由位线提供给存储单元的位线电压(V bit)的电平作为布线距离。写入电路(15)的电压越高,则存储单元阵列的各存储单元中的写入速度的变动变小。

著录项

  • 公开/公告号DE60227893D1

    专利类型

  • 公开/公告日2008-09-11

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD.;

    申请/专利号DE20026027893T

  • 发明设计人 KUROSAKI KAZUHIDE;

    申请日2002-09-04

  • 分类号G11C16/06;G11C16/10;G11C16/12;

  • 国家 DE

  • 入库时间 2022-08-21 19:47:50

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