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The to component with the finger tester and the finger tester for inspecting the printed circuit baseplate which is not converted to component the method of inspecting the printed circuit baseplate which is not converted
The to component with the finger tester and the finger tester for inspecting the printed circuit baseplate which is not converted to component the method of inspecting the printed circuit baseplate which is not converted
This invention uses two test fingers 1 at least, to component being the finger tester for inspecting the printed circuit baseplate which is not converted, each of the test finger has had test probe 2, on test probe 2, it regards the finger tester where detection device 20 in order to detect at least the position of one contact tip/chip of test probe 2 optically has. It is arranged by the plane surface where 2 or detection device 20 of test finger 1 above that is separated vertically and differs, the territory of the detection device which has been located at least on test probe 2 being located mutually on, contact dying it is lined up vertically.
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